Participation in the international conference ATOM-N 2020

The 10th edition of the International Conference “Advanced Topics in Optoelectronics, Microelectronics and Nanotechnologies” (ATOM-N 2020) took place between 20 and 23 August 2020, an event organized by the Center for Research in Optoelectronics at the “Politehnica” University of Bucharest and the Maritime University of Constanța.

The following papers were presented at this conference:

“Measurements of the emission parameters of a WiMax BTS under interference conditions”, authors: Eugen STANCU, Cristian CAPOTĂ, Alexandru BADEA, Simona HALUNGA, Nicolae VIZIREANU.
“Processing gain considerations on compromising emissions”, authors: Răzvan BĂRTUŞICĂ, BOITAN Alexandru, Octavian FRATU, Mădălin MIHAI.
“Vulnerabilities in Authentication Process GSM standard – RF measurements Theoretical and Practical Aspects”, authors: Cristian CAPOTĂ, Octavian FRATU, STANCU Eugen, Mihai GĂINĂ, Dragos VIZIREANU.

Communications will be indexed to SPIE and ISI.

The conference was a special opportunity to disseminate the activity of the SIIMA team and to establish contacts with people whose area of ​​activity is similar to that of our research team.